I was referring to the five tests at 1/2 Ideltan, Ideltan (x 2), and 5 Ideltan (x2). Performing them and writing them in a notebook is no bother at all.
Don't disagree with you. I think from the Table in my previous post, you will see where my thinking is coming from re 10 and 30 mA RCDs.
And, more importantly, where JP is going with higher rated RCDs. The rub being, that a designer could select an RCD with rating 500 mA Type S to meet 411.3.2.1, and, providing the loop impedance were low enough to achieve the stated disconnection time (in this case, 200 Ohm would be good enough for the 200 ms disconnection time at 2x, or 1 A) , all would be well ...
That is, until we come to our Initial Verification (or with existing installations Periodic Verification) in accordance with BS 7671:2018 - if we take 643.7.1 b) (2) at its verbatim word !
I was referring to the five tests at 1/2 Ideltan, Ideltan (x 2), and 5 Ideltan (x2). Performing them and writing them in a notebook is no bother at all.
Don't disagree with you. I think from the Table in my previous post, you will see where my thinking is coming from re 10 and 30 mA RCDs.
And, more importantly, where JP is going with higher rated RCDs. The rub being, that a designer could select an RCD with rating 500 mA Type S to meet 411.3.2.1, and, providing the loop impedance were low enough to achieve the stated disconnection time (in this case, 200 Ohm would be good enough for the 200 ms disconnection time at 2x, or 1 A) , all would be well ...
That is, until we come to our Initial Verification (or with existing installations Periodic Verification) in accordance with BS 7671:2018 - if we take 643.7.1 b) (2) at its verbatim word !
