Playing Devil's advocate for a moment... on a TT system is there a requirement to test a 30mA unit at 1x at all? While I can of course see the common sense in testing at 30mA, 643.8 seems only to actually require:
Also is there any value in using a lower multiple on a higher setting on the test instrument - e.g. using a 300mA x 1 as a better approximation to a 2x test for a 100mA device than a 5x 100mA test (and reduce the reliance on a low Zs in the process). Or is that instrument abuse?
On a different tangent, should we be verifying the RCD's reaction to d.c. components in the residual current too these days?
Playing Devil's advocate for a moment... on a TT system is there a requirement to test a 30mA unit at 1x at all? While I can of course see the common sense in testing at 30mA, 643.8 seems only to actually require:
Also is there any value in using a lower multiple on a higher setting on the test instrument - e.g. using a 300mA x 1 as a better approximation to a 2x test for a 100mA device than a 5x 100mA test (and reduce the reliance on a low Zs in the process). Or is that instrument abuse?
On a different tangent, should we be verifying the RCD's reaction to d.c. components in the residual current too these days?
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