I think the old RCD was getting a bit trip happy in its old age, unlike its new fresh out of the box cousin and did not like the freezer kicking in.
I'd be surprised and interested if RCDs get more trip-happy. I can't imagine a mechanism for it.
I think it's just that they were always trigger-happy [edit: trip-happy], but that: (a) modern loads are better at stimulating the trip-happiness, and (b) modern RCDs are less trip-happy because of the standards requirements. How much (a) caused (b) or vice versa I don't try hard to guess .. it was sensible to do (b) anyway as there were cases of RCDs tripping on transients from the supply that caused currents in L-PE or N-PE capacitance.
I think the old RCD was getting a bit trip happy in its old age, unlike its new fresh out of the box cousin and did not like the freezer kicking in.
I'd be surprised and interested if RCDs get more trip-happy. I can't imagine a mechanism for it.
I think it's just that they were always trigger-happy [edit: trip-happy], but that: (a) modern loads are better at stimulating the trip-happiness, and (b) modern RCDs are less trip-happy because of the standards requirements. How much (a) caused (b) or vice versa I don't try hard to guess .. it was sensible to do (b) anyway as there were cases of RCDs tripping on transients from the supply that caused currents in L-PE or N-PE capacitance.
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