» Scanning Electron Microscopes (SEM) - A Nanometre Scale Perspective.
Joint IET and I Mech E presentation on 23 April 2015 - 18:30-20:00 at CUED.
SEM has been in use in various applications including aircraft engine failure analysis, medical, mining, electron beam nanolithography and semiconductor integrated circuit inspection. Dr Annie Loo from Zeiss Cambridge, will give a talk on the design, development and use of SEM.