The 1x test is no longer a requirement but could of course be carried out. ...
The problem I see is that as the advice as written it may well be possible to have an RCD that does meet 40ms at some arbitrary high current but would not do the required at 30mA.
I have a sneaking suspicion that what was lost in translation should have been more like
40 ms when tested at currents equal to AND higher than.
So that would mean that it must make 40ms at 5 times, and must not respond more slowly at any higher currents. It is hard to see why that failure mode would occur however, and that is sadly not what it says.
The 1x test is no longer a requirement but could of course be carried out. ...
The problem I see is that as the advice as written it may well be possible to have an RCD that does meet 40ms at some arbitrary high current but would not do the required at 30mA.
I have a sneaking suspicion that what was lost in translation should have been more like
40 ms when tested at currents equal to AND higher than.
So that would mean that it must make 40ms at 5 times, and must not respond more slowly at any higher currents. It is hard to see why that failure mode would occur however, and that is sadly not what it says.
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