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John Peckham:
Chris
You have fallen in to the usual trap of not understanding the major difference between Initial Verification and Periodic Inspection and Testing.
John, that's a bit unfair!
My point was that for a periodic, L-N testing is unnecessary and as the OP said, practically impossible. How would you test a socket circuit with SRCD or USB where the manufacturer's instructions are that it should be disconnected when IR testing?
As an aside, when testing at stages during erection, to start with the IR rapidly goes up to > 999 MΩ; but after a while it creeps up more slowly, especially when testing live to CPC. > 500 MΩ is certainly enough for me, but one could stop pressing the button as soon as it gets over 2 MΩ, or any value in between.
John Peckham:
Chris
You have fallen in to the usual trap of not understanding the major difference between Initial Verification and Periodic Inspection and Testing.
John, that's a bit unfair!
My point was that for a periodic, L-N testing is unnecessary and as the OP said, practically impossible. How would you test a socket circuit with SRCD or USB where the manufacturer's instructions are that it should be disconnected when IR testing?
As an aside, when testing at stages during erection, to start with the IR rapidly goes up to > 999 MΩ; but after a while it creeps up more slowly, especially when testing live to CPC. > 500 MΩ is certainly enough for me, but one could stop pressing the button as soon as it gets over 2 MΩ, or any value in between.
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