John Hill TMIET:
This issue came up on the 18th edition course. The testing procedure for rcd's hasn't changed, it's just the requirement to record the 1x IΔn value that has been removed.
On a 30ma device for additional protection you still need to test at 1/2 x IΔn to rule out nuisance tripping, 1x IΔn to confirm normal operation and the 5 x IΔn value is recorded. If for some strange reason the device does not trip out within the required time at 1 x IΔn then it would be recorded as a C2 in the observations and would need to be repaced, regardless of the 5 x value.
some are failing at 150mA. This is making the RCD less effective for additional protection as well as causing problems for testing. They've been sent back as faulty.
It says x5 OR above.
Whatever the regs say I think they are wrong about testing RCDs. I also thing that it is a mistake in BS61008 to change the current resquired for 40ms trip from 150mA to 250mA
Sparkymania:
John Hill
Agreed, but as Sparkingchip pointed out, the model forms just say "disconnection time (ms)", It does not specify a multiplier.
Therefore I would now record the highest trip time of either the x1 or x5 tests.
Looking further last night, someone on another forum had said the same thing and I think that's the best way.
Oh yes they do!
Andy Betteridge
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